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Description / Abstract:
Part 3-1 of IEC 62321 describes the screening analysis of five
substances, specifically lead (Pb), mercury (Hg), cadmium (Cd),
total chromium (Cr) and total bromine (Br) in uniform materials
found in electrotechnical products, using the analytical technique
of X-ray fluorescence (XRF) spectrometry.
It is applicable to polymers, metals and ceramic materials. The
test method may be applied to raw materials, individual materials
taken from products and "homogenized" mixtures of more than one
material. Screening of a sample is performed using any type of XRF
spectrometer, provided it has the performance characteristics
specified in this test method. Not all types of XRF spectrometers
are suitable for all sizes and shapes of sample. Care should be
taken to select the appropriate spectrometer design for the task
concerned.