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Description / Abstract:
This part of IEC 62132 describes a bulk current injection (BCI)
test method to measure the immunity of integrated circuits (IC) in
the presence of conducted RF disturbances, e.g. resulting from
radiated RF disturbances. This method only applies to ICs that have
off-board wire connections e.g. into a cable harness. This test
method is used to inject RF current on one or a combination of
wires.
This standard establishes a common base for the evaluation of
semiconductor devices to be applied in equipment used in
environments that are subject to unwanted radio frequency
electromagnetic signals.